Monday, 12 March 2012

Failure Analysis of Integrated Circuits using THz EOTPR

TeraView will be exhibiting at the 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2012.  

Dates: 2nd - 6th July 2012

Location: Marina Bay Sands®, Singapore

This conference is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society. Also, IPFA will be celebrating its 25th year in 2012. 

For more information about the conference please click here  

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For information about TeraView's products please visit

Come and visit us!

To organise a meeting either at the conference or if you would like to learn more about how our products can help solve your problems please e-mail Martin Igarashi (