Monday, 12 March 2012

Failure Analysis of Integrated Circuits using THz EOTPR

TeraView will be exhibiting at the 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2012.  


Dates: 2nd - 6th July 2012


Location: Marina Bay Sands®, Singapore


This conference is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society. Also, IPFA will be celebrating its 25th year in 2012. 

For more information about the conference please click here  

(http://ewh.ieee.org/reg/10/ipfa/index.php/home )


For information about TeraView's products please visit
http://www.teraview.com/products/thz-reflectometry/index.html

Come and visit us!

To organise a meeting either at the conference or if you would like to learn more about how our products can help solve your problems please e-mail Martin Igarashi (martin.igarashi@teraview.com)