Wednesday, 27 February 2013

March Offer – 10% off TeraView NDT contract analysis

Would you like to try THz analysis on some of your samples? Are you new to THz analysis? Do you think THz can help? As part of our commitment to problem solving and non-destructive testing analysis, TeraView is pleased to offer a 10% discount on list prices over any contract analysis tests for new contracts taken within the month of March.

Terahertz light can be used as non-contact technique for analysis in material integrity studies. It has proved to be effective in:
  • Non-destructive inspection of layers in paints and coatings
  • Detecting structural defects in ceramic and composite materials 
  • Imaging the physical structure of paintings and manuscripts
  • Material integrity studies of paper, plastics and woods
  • Inspection and cracks and defects buried in silicon
The use of THz waves for non-destructive evaluation enables inspection of multi-layered structures and can identify abnormalities from foreign material inclusions, disbond and delamination, mechanical impact damage, heat damage, and water or hydraulic fluid ingression.

This is a great opportunity to test whether terahertz can help your analysis!

Contact us for a quote at

For more information on TeraView’s contract analysis services please visit our services page.

Terms and conditions:
Offer period: 1st to 31st March 2013. Open to new and existing customers. For full terms and conditions please contact us.

Tuesday, 26 February 2013

OTST 2013: International Workshop on Optical Terahertz Science and Technology 2013 - Kyoto, Japan April 1-5

Technical Programme Announced

International Workshop on Terahertz Science and Technology 2013 (OTST2013) will be held in Kyoto, Japan April 1-5, 2013. OTST2013 is part of a series of conferences held every two years. The aim of this workshop is to foster discussion on the newest and most exciting research in the development and applications of terahertz instrumentation based on optical sources. Emphasis will be placed on sources and applications at wavelengths between 30 and 3000 microns (0.1-10 THz).

+TeraView will be represented at booth 8 (Conference Room) by +Philip Taday, who will talk about the Development and Application of Terahertz Pulsed Imaging for Noncontact and Non-destructive Inspection of materials on Wednesday 3, April at Session W5B-1, 16:50-17:15.

Thursday, 7 February 2013

Surface State Charge Dynamics of a High-Mobility Three-Dimensional Topological Insulator

Jason N. Hancock1, J. L. M. van Mechelen1, Alexey B. Kuzmenko1, Dirk van der Marel1, Christoph Brüne2, Elena G. Novik2, Georgy V. Astakhov2, Hartmut Buhmann2, and Laurens W. Molenkamp2
1Département de Physique de la Matière Condensée, Université de Genève, quai Ernest-Ansermet 24, CH 1211 Genève 4, Switzerland
2Physikalisches Institut der Universität Würzburg - 97074 Würzburg, Germany

DOI: 10.1103/PhysRevLett.107.136803
PACS: 73.25.+i, 03.65.Vf, 73.20.Mf, 78.20.Ls

Abstract: We present a magneto-optical study of the three-dimensional topological insulator, strained HgTe, using a technique which capitalizes on advantages of time-domain spectroscopy to amplify the signal from the surface states. This measurement delivers valuable and precise information regarding the surface-state dispersion within <1  meV of the Fermi level. The technique is highly suitable for the pursuit of the topological magnetoelectric effect and axion electrodynamics.
The measurements in this paper were acquired using +TeraView's TPS Spectra 3000. Please visit our webpage on Publications on Terahertz Technology to view or download more papers.

Monday, 4 February 2013

T-Ray NDE Inspections on the Fiber Direction of Thermoplastic PPS-Based CFRP Composites

ISSN: 1662-8985

KH Im, DK Hsu, CP Chiou, DJ Barnard 

Terahertz ray (T-ray) imaging has been emerged as one of the most promising new powerful nondestructive evaluation (NDE) techniques, and new application systems are under processing development for the area applications. The terahertz time domain spectroscopy (THz TDS) can be considered as a useful tool using general non-conducting materials; however it is quite limited to conducting materials. In this study, a new time-domain spectroscopy system was utilized for detecting and evaluating layup effect and flaw in FRP composite laminates. In order to solve various material properties, the index of refraction (n) and the absorption coefficient (α) are derived in reflective and transmission configuration using the terahertz time domain spectroscopy. However, the T-ray is limited in order to penetrate a conducting material to some degree. So, investigation of terahertz time domain spectroscopy (THz TDS) was made and reflection and transmission configurations were studied for a 48-ply thermoplastic PPS (poly-phenylene sulfide)-based CFRP solid laminate.
The measurements in this paper were acquired using TeraView's TPS Spectra 3000. In particular, the gantry was used as a module to the Spectra 3000.
In the article, details of the instrumentation as well as pictures of the setup can be found: .... "Page 2. Fig.1. Photo of the experimental setup used for terahertz transmission imaging.
Terahertz Radiation The terahertz instrumentation systems used in this research were
provided by TeraView Limited."  ...

Friday, 1 February 2013

International Conference on Semiconductor Mid-IR Materials and Optics SMMO2013

1st Annual Conference of COST Action MP1204  will be held in Warsaw, Poland, from February 27 to March 2, 2013
Detailed information you can find on the conference web side:

The Conference will be arranged jointly with the International Conference on Semiconductor Mid-IR Materials and Optics SMMO2013, which is a regular event organized by Polish Chapter of IEEE Photonics Society and devoted to issues important for realization of semiconductor MIR emitters and detectors as well as their application for environmental control, medical diagnostics and security. The programme of both events will be separated, but SMMO Conference will be open to COST audience and vice versa. We hope this conjunction will give you a unique opportunity to share your experience and discuss wide range of subjects related to both MIR and THz optoelectronic devices.

The conference will be organized as a combination of plenary lectures given by worldwide recognized experts and short contributed oral presentations. The organizers encourage especially young scientists to participate in the conference.

TeraView will be partecipating in the event.

For a full list of events in which TeraView is partecipating, visit our events webpage.