Military University of Technology
AbstractWe report on a method for extracting the characteristic features of covered materials, including hexogen, in the range from 0.5 to 1.8 THz. This time-domain spectroscopy-based technique takes into account only part of the signal reflected from a covered sample and analyzes it by using the Fourier transform. The obtained power spectrum has distinctive peaks that correspond to peaks measured in the transmission configuration and can be used for further identification of the materials.
This study was performed using TeraView's TPS Spectra 3000 system. (TeraView, Cambridge, UK)
Full Article: http://opticalengineering.spiedigitallibrary.org/article.aspx?articleid=1787555