Thursday, 7 November 2013

TeraView at ISTFA 2013

TeraView were recently at ISTFA 2013 from the 4th - 7th of November.

Here is Stephane Barbeau from IBM for his talk:

ElectroElectro Optical Terahertz Pulse Reflectometry - a Fast and Highly Accurate Non-Destructive Fault Isolation Technique for 3D Flip Chip Packages 

As well as the TeraView Booth. 
Stephane Barbeau