Tuesday, 8 October 2013

The Society for Applied Spectroscopy (SAS) UK Regional Section will hold its 3rd Annual Technical Meeting: “Graphene Spectroscopy”

The Society for Applied Spectroscopy (SAS) UK Regional Section will host its 3rd Annual Technical Meeting Graphene Spectroscopy on Tuesday 29th October 2013. This one day meeting will be held at Trinity Hall in Cambridge and will focus on recent advances in the characterization of graphene and two dimensional crystals by spectroscopic methods.

Graphene, thanks to its unique structural and electronic properties, has been called the “miracle material” of the 21st Century. Its isolation in 2004 has sparked a considerable scientific activity that has now established a broad international community with interest ranging from fundamental studies to applications in different fields e.g. composite materials, (opto)electronics, energy, etc. Graphene is just the first of a new class of two dimensional (2d) materials, derived from layered bulk crystals.

Studying and understanding the structure of graphene and 2d crystals is therefore of utmost importance for materials optimization and devices integration. This timely meeting strives to bring together international stakeholders in the field, to give perspectives on the current status of graphene spectroscopy. 


The speakers will be:


Prof. Ping-Heng Tan, Chinese Academy of Sciences, Beijing, P.R. China, “Application of ultra-low frequency Raman spectroscopy in two-dimensional layered materials.”
Prof. Andrea C. Ferrari, Cambridge Graphene Centre, UK, “Raman Spectroscopy in Graphene: State of the Art” 
Dr. Cinzia Casiraghi, University of Manchester, UK. "Raman spectroscopy of defective graphene: Effect of the excitation energy, type, amount of defects and applied gate voltage."
Dr. Duhee Yoon Cambridge Graphene Centre, UK, “Raman spectroscopy for characterization of strained 
graphene.”
Prof. Günter G. Hoffmann, Eindhoven University of Technology, The Netherlands, “Tip-enhanced Raman Spectroscopy (TERS) and Mapping (TERM) of graphene and related materials”.
Prof. Giulio Cerullo, Politecnico di Milano, Italy. "Ultrafast electron-electron scattering in graphene.”
Prof. Euan Hendry, University of Exeter, UK. "Ultrafast optical measurements of graphene."
Dr. Michael Johnston, University of Oxford, UK. Terahertz spectroscopy of graphene.”
Dr. Rahul Raveendran-Nair, University of Manchester, UK, Characterisation of graphene and its chemical derivatives by different spectroscopic techniques.”


[The scientific program for the meeting has been co-organised by Francesco Bonaccorso (CNR-IPCF (Italy) and CGC, Cambridge University) and John Chalmers (SAS UK Regional Section.]

For registration details for this meeting or for more information, please email: