TeraView will be exhibiting at the 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2012.

Dates: 2nd - 6th July 2012


Location: Marina Bay Sands®, Singapore

For more information about the conference please click here  
(http://ewh.ieee.org/reg/10/ipfa/index.php/home )


For information about TeraView's products please visit
http://www.teraview.com/products/thz-reflectometry/index.html

Come and visit us!

To organise a meeting please e-mail Martin Igarashi (martin.igarashi@teraview.com)